| NEWS |
| June 3, 2008 |
Si2:
Takumi Technology Joins Si2’s Design-For-Manufacturability Coalition |
| February 1, 2008 |
EETimes:
Takumi Technology named one of EETimes top 60 emerging startups |
| July 30, 2007 |
EETimes:
Minimizing layout hot spots at the 45-nm node |
| July 18, 2007 |
EDA Café:
Takumi Technology Named a Winner in Technology Innovation Showcase at SEMICON WEST 2007 |
| June 28, 2007 |
EETimes:
EE Times updates list of emerging startups |
| June 26, 2007 |
Reed Electronics:
Takumi Adds Automated Hot Spot Correction to DFM Toolset |
| June 9, 2007 |
EDA Design Line:
The EDA dozen |
| June 1, 2007 |
Takumi makes it to Gary Smith’s must see list at DAC 2007 |
| Febuary 28, 2007 |
EETimes Asia:
DNP, Takumi partner on photomask inspection |
| |
| PRESS RELEASES |
| June 4, 2008 |
Takumi Expands Its Layout Optimization Tools to Support Automated Enforcement of Recommended Rules |
| September 19, 2007 |
Takumi Technology Teams With Chartered on DFM Optimization Technology |
| April 24, 2007 |
Renesas Technology Adopts Takumi Technology’s Layout Optimization Tools for Automatic Repair of Layout Hot Spots |
| April 9, 2007 |
Takumi Technology to Present Paper on Automatic Removal of Layout Hot Spots at Photomask Japan 2007 |
| Feburary 26, 2007 |
Dai Nippon Printing, Takumi Technology and a major semiconductor maker jointly developed automated criticality aware photo-mask inspection system |
| |
| EVENTS |
| September 30, 2008 |
Takumi Technology will exhibit at the 2008 Common Platform Technology Forum in Santa Clara, California |
| October 7-8, 2008 |
Takumi Technology will release two papers at the SPIE Photomask BACUS in Monterey, California
- DFM viewpoints of cell-level layout assessments and indications for concurrent layout optimization
- Flexible sensitivity inspection with TK-CMI software for criticality awareness
|
| June 8-13, 2008 |
Takumi Technology exhibited at the 45th DAC in Anaheim, California |
| February 24-29, 2008 |
Takumi Technology will present three papers at SPIE Advanced Lithography Conference |
| January 24-25, 2008 |
Takumi Technology to exhibit at the EDSFair 2008 at PACIFICO YOKOHAMA, Kanagawa, Japan |
| November 6, 2007 |
Takumi Technology to exhibit at the Common Platform Technology Forum |
| September 17-18, 2007 |
Takumi Technology will present two papers at SPIE Photomask Technology Conference. |
| |
| SUCCESS STORIES |
| April 24, 2007 |
Renesas Cuts 66% Off Their 65nm Library Development Schedule |
| |
| ARCHIVES |
| July 12, 2006 |
Takumi Technology Introduces Two New DFM Products for IC Layout Optimization |
| July 12, 2006 |
DFM startup targets 'hot spot' detection, repair |
| May 31, 2006 |
Takumi Technology Announces Partnership With Toshiba |
| May 31, 2006 |
Toshiba Collaborating with DFM Startup |
| May 1, 2006 |
SILICON ENGINEERING: DFM startup pinpoints a design's critical areas |
| April 20, 2006 |
Applied Materials-backed DFM startup emerges |
| April 19, 2006 |
Takumi Technology Announces Deployment of Criticality Aware Design Flow by NEC Electronics |
| January 18, 2006 |
SOMETHING VENTURED: Applied Materials Reinforces VC Fund |
